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Double subband occupation of the two-dimensional electron gas in In xAl1 - XN/AlN/GaN/AlN heterostructures with a low indium content (0.064 ≤ x ≤ 0.140) barrier

机译:铟含量低(0.064≤x≤0.140)势垒的In xAl1-XN / AlN / GaN / AlN异质结构中二维电子气的双子带占据

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摘要

We present a carrier transport study on low indium content (0.064 ≤ x ≤ 0.140) InxAl1 - xN/AlN/GaN/AlN heterostructures. Experimental Hall data were carried out as a function of temperature (33-300 K) and a magnetic field (0-1.4 T). A two-dimensional electron gas (2DEG) with single or double subbands and a two-dimensional hole gas were extracted after implementing quantitative mobility spectrum analysis on the magnetic field dependent Hall data. The mobility of the lowest subband of 2DEG was found to be lower than the mobility of the second subband. This behavior is explained by way of interface related scattering mechanisms, and the results are supported with a one-dimensional self-consistent solution of non-linear Schrödinger- Poisson equations. © 2010 Elsevier B.V.
机译:我们提出了对低铟含量(0.064≤x≤0.140)InxAl1-xN / AlN / GaN / AlN异质结构的载流子传输研究。实验霍尔数据是温度(33-300 K)和磁场(0-1.4 T)的函数。在对依赖于磁场的霍尔数据进行定量迁移谱分析之后,提取具有一个或两个子带的二维电子气(2DEG)和一个二维空穴气。发现2DEG的最低子带的迁移率低于第二子带的迁移率。通过与界面有关的散射机制来解释这种行为,并且非线性一维Schrödinger-Poisson方程的一维自洽解支持了该结果。 ©2010 Elsevier B.V.

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